{ "id": "epmjnpztgy", "slug": "microspectroscopy", "title": "Microspectroscopy", "updated": "2026-10-15", "topic_path": [ { "id": "physical", "label": "Physical world and mathematics", "api_url": "https://www.edgepedia.org/api/v1/topics/physical" }, { "id": "physical.physics", "label": "Physics", "api_url": "https://www.edgepedia.org/api/v1/topics/physical.physics" }, { "id": "physical.physics.practice", "label": "Physics methods, practice, and community", "api_url": "https://www.edgepedia.org/api/v1/topics/physical.physics.practice" }, { "id": "physical.physics.practice.electron-microscopy-methods", "label": "Electron microscopy methods", "api_url": "https://www.edgepedia.org/api/v1/topics/physical.physics.practice.electron-microscopy-methods" } ], "geo": [ { "id": "geo.nongeo.t1946.physical.physics.practice.electron-microscopy-methods", "label": "Non-geographic · 1946 to 2000: Electron microscopy methods", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946.physical.physics.practice.electron-microscopy-methods", "path": [ { "id": "geo.nongeo", "label": "Non-geographic", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo" }, { "id": "geo.nongeo.t1946", "label": "Non-geographic · 1946 to 2000", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946" }, { "id": "geo.nongeo.t1946.physical", "label": "Physical world and mathematics", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946.physical" }, { "id": "geo.nongeo.t1946.physical.physics", "label": "Physics", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946.physical.physics" }, { "id": "geo.nongeo.t1946.physical.physics.practice", "label": "Physics methods, practice, and community", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946.physical.physics.practice" }, { "id": "geo.nongeo.t1946.physical.physics.practice.electron-microscopy-methods", "label": "Electron microscopy methods", "api_url": "https://www.edgepedia.org/api/v1/geo/geo.nongeo.t1946.physical.physics.practice.electron-microscopy-methods" } ] } ], "excerpt": "Microspectroscopy, also called photoelectron microspectroscopy or photoemission spectromicroscopy, is a family of surface-analysis methods that maps chemical state and electronic structure with nanometer spatial resolution.", "snippet": "Microspectroscopy, also called photoelectron microspectroscopy or photoemission spectromicroscopy, is a family of surface-analysis methods that maps chemical state and electronic structure with nanometer spatial resolution.", "node": "physical.physics.practice.electron-microscopy-methods", "markdown": "# Microspectroscopy\n\nPhotoelectron microspectroscopy, also called photoemission spectromicroscopy, is a family of surface-analysis methods that records a photoelectron spectrum, an image, or an image stack from microscopic regions of a sample, so that chemical state and electronic structure are mapped with spatial resolution; it is distinct from microspectroscopy in the broader sense, which combines optical microscopy with molecular spectroscopy such as Raman, infrared, or fluorescence methods. The two main implementations are [X-ray photoemission electron microscopy](https://www.edgepedia.org/x-ray-photoemission-electron-microscopy) (XPEEM), which images the electrons emitted from an irradiated area, and scanning photoelectron microscopy (SPEM), which scans a demagnified photon probe across the sample.[1](https://www.elettra.eu/lightsources/elettra/elettra-beamlines/nanospectroscopy/xpeem.html) • [2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) • [3](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X) The data product is therefore both: a spectrum of intensity versus electron kinetic or binding energy at a point, or a chemically resolved image built from energy-selected or energy-scanned frames.[2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) [Laboratory](https://www.edgepedia.org/laboratory) instruments driven by extreme ultraviolet (EUV) and vacuum-ultraviolet (VUV) sources extend this capability outside synchrotron facilities.[4](https://www.jstage.jst.go.jp/article/ejssnt/22/1/22_2023-066/_pdf/-char/ja) • [5](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29)\n\n| Key fact | Value |\n|---|---|\n| Measured quantity | Photoelectron spectra and images; micro-XPS and micro-XAS from image series versus photon energy[2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) |\n| Best spatial resolution | 2.6 nm with a 4.66 eV (266 nm) laser; 10 nm with monochromatic X-rays and 7.2 nm with UV illumination (SPHINX X-PEEM)[6](https://home.physics.wisc.edu/gilbert2/wp-content/uploads/sites/3/2017/08/85.pdf) |\n| Energy resolution | 24 meV (VUV-laser NanoESCA, Au(111) at 50 K) to ~0.5 eV (laboratory XPS imaging)[4](https://www.jstage.jst.go.jp/article/ejssnt/22/1/22_2023-066/_pdf/-char/ja) • [7](https://www.ascent.network/product/xpeem-spectro-microscope/) |\n| Probing depth | A few nanometers; photoelectrons escape from the top few tens of Å[2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) • [3](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X) |\n| Acquisition time | 0.4 s per time-of-flight spectrum (laser microspot); 300 ms per energy (SPEM); video rate to hours per image[8](https://www.sciencedirect.com/science/article/abs/pii/S0039602803001961) • [9](https://nffa.eu/offer/area/technique/?id=6305) • [2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) |\n| Laboratory EUV source | Gas-discharge plasma at 17.3 nm (71.7 eV), kHz repetition rate, 63.3 ± 11.2 ns pulses[5](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29) |\n\n## How it works\n\nThe method rests on the photoelectric effect. A photon of energy \\( h\\nu \\) ejects a core-level or valence electron whose kinetic energy outside the sample is \\( E_{\\mathrm{kin}} = h\\nu - E_{\\mathrm{bin}} - \\phi \\), where \\( E_{\\mathrm{bin}} \\) is the binding energy and \\( \\phi \\) the work function.[1](https://www.elettra.eu/lightsources/elettra/elettra-beamlines/nanospectroscopy/xpeem.html) Measuring \\( E_{\\mathrm{kin}} \\) therefore yields the binding-energy spectrum that identifies elements and chemical states. The energy scale is calibrated against the analyzer work function, not the sample's: \\( E_{\\mathrm{b}} = \\hbar\\omega - (E_{\\mathrm{p}} - \\Phi_{\\mathrm{analyzer}} - R) \\).[10](https://labadviser.nanolab.dtu.dk/images/f/f7/Electron_Spectroscopy_of_surfaces.pdf)\n\nSurface sensitivity comes from the electron, not the photon: X-rays penetrate 1000 nm or more, but the probability that a 5–1500 eV photoelectron escapes without inelastic scattering decays exponentially with depth, so only the top few nanometers contribute.[10](https://labadviser.nanolab.dtu.dk/images/f/f7/Electron_Spectroscopy_of_surfaces.pdf) Typical photoelectron kinetic energies of 50–150 eV sit near the minimum of the inelastic mean free path.[1](https://www.elettra.eu/lightsources/elettra/elettra-beamlines/nanospectroscopy/xpeem.html)\n\nSpatial resolution is set by electron optics, not by the light. In a PEEM-type instrument the extraction field accelerates photoelectrons to 10–20 keV, so resolution is not limited by the diffraction limit of the incident light; 2.6 nm has been achieved with a 4.66 eV (266 nm) laser.[4](https://www.jstage.jst.go.jp/article/ejssnt/22/1/22_2023-066/_pdf/-char/ja)\n\n## How it is done\n\nThe sample is prepared and measured under ultrahigh vacuum, below \\( 1 \\times 10^{-9} \\) mbar, reached after roughly 24 h bakeout at 160–180 °C, to keep surfaces clean and avoid scattering of photoelectrons by residual gas.[10](https://labadviser.nanolab.dtu.dk/images/f/f7/Electron_Spectroscopy_of_surfaces.pdf) A source is selected: UV or He discharge lamps (He I 21.22 eV, He II 40.8 eV), a monochromated Al Kα source at 1486.6 eV, a gas-discharge EUV plasma, or a synchrotron beamline covering, for example, 200–2000 eV with \\( \\Delta E/E \\) of \\( 2.5 \\times 10^{-4} \\).[7](https://www.ascent.network/product/xpeem-spectro-microscope/) • [5](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29) • [2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) EUV and VUV sources are monochromatized by Bragg mirrors or by grazing-incidence gratings; a laboratory EUV arrangement uses a gas-discharge plasma emitting at 17.3 nm (71.7 eV), monochromatized by Al/Mo-based Bragg mirrors with bandwidth \\( \\Delta\\lambda < 0.3 \\) nm, feeding a Focus NanoESCA energy-filtering PEEM.[5](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29)\n\nThe analyzer is the second key component. The NanoESCA design uses a PEEM as the entrance lens of a high-transmission, aberration-compensated double hemispherical imaging spectrometer, with five pass energies (12.5–200 eV) and slits from 0.2 to 8 mm; it collects photoelectrons over 2π sr for kinetic energies below about 34 eV.[11](https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.3521) • [4](https://www.jstage.jst.go.jp/article/ejssnt/22/1/22_2023-066/_pdf/-char/ja) [Time-of-flight](https://www.edgepedia.org/time-of-flight) and hemispherical momentum microscopes are alternatives.[12](https://www.nature.com/articles/s41598-025-86660-1) Turnkey systems exist: the Scienta Omicron NanoESCA combines UV, He-discharge, and monochromated Al Kα sources with energy-filtered imaging in one instrument.[7](https://www.ascent.network/product/xpeem-spectro-microscope/) Data are then extracted as images at fixed energy, spectra from selected regions, or image stacks versus photon energy.[2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf)\n\n## Origin\n\nPhotoemission spectroscopy is based on the photoelectric effect and measures photoemitted electrons, including UPS valence-band spectra and high-resolution XPS/ESCA.[13](https://iopscience.iop.org/article/10.1088/1367-2630/7/1/097/pdf) XPS was recognized with the Nobel prize in physics.[3](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X)\n\nThe spectromicroscopy line of development runs through several landmark instruments. O. H. Griffith and colleagues reported photoelectron microscopy for mapping organic and biological surfaces in *PNAS* in 1972.[14](https://doi.org/10.1073/pnas.69.3.561) G. Beamson, H. Q. Porter and D. W. Turner reported photoelectron spectromicroscopy in *Nature* in 1981, using a strong divergent magnetic field to define electron trajectories without electron-optical focusing.[15](https://doi.org/10.1038/290556a0) B. P. Tonner and G. R. Harp introduced synchrotron photoyield spectromicroscopy (X-PEEM) in 1989, after which instrumental development was rapid.[16](https://doi.org/10.1116/1.575760) • [6](https://home.physics.wisc.edu/gilbert2/wp-content/uploads/sites/3/2017/08/85.pdf) The same year, H. H. Rotermund and colleagues reported scanning photoemission microscopy of oscillatory surface reactions in *The Journal of Chemical Physics*.[17](https://doi.org/10.1063/1.456735) Harald Ade and colleagues demonstrated zone-plate X-ray spectromicroscopy in 1990.[18](https://doi.org/10.1063/1.103064) W. Engel and colleagues built a UHV-compatible photoelectron emission microscope for surface science in 1991,[19](https://doi.org/10.1016/0304-3991%2891%2990146-w) Toshiaki Munakata and Takahiro Kasuya reported a laser-based photoelectron spectromicroscope in 1993,[20](https://doi.org/10.1016/0039-6028%2893%2991018-k) and Th. Schmidt and colleagues combined LEEM with spectroscopic imaging (SPELEEM) in 1998.[21](https://doi.org/10.1142/s0218625x98001626) Reviews by A. Locatelli and E. Bauer (2008) summarize the XPEEM state of the art,[22](https://doi.org/10.1088/0953-8984/20/9/093002) and T. T. Luu and colleagues opened EUV high-harmonic spectroscopy of solids in 2015.[23](https://doi.org/10.1038/nature14456)\n\n## Variants\n\n**XPEEM and SPEM** are complementary. XPEEM magnifies the image of the irradiated area with electron optics; SPEM demagnifies the photon beam to submicrometer spots with zone plates (ring-structured lenses that focus X-rays) and forms images by scanning.[3](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X)\n\n**NanoESCA and kPEEM** add energy filtering and reciprocal-space imaging. The Elettra NanoESCA combines a non-magnetic electrostatic PEEM lens with a double-pass hemispherical analyzer for spectroscopy from the VUV into the hard x-ray regime, and spin-resolved photoelectron momentum microscopy is now also established at other synchrotron facilities, including the UVSOR Synchrotron Facility and the development of spin-filter momentum microscopy at [PETRA III](https://www.edgepedia.org/petra-iii)'s P22 beamline.[24](https://www.elettra.eu/elettra-beamlines/Nanoesca.html) Its kPEEM mode is equivalent to micro-ARPES and is much faster, because parallel angular valence-band imaging needs no sample rotation.[9](https://nffa.eu/offer/area/technique/?id=6305) kPEEM provides band structure over areas larger than 10 × 10 µm² with momentum resolution typically 0.05 Å⁻¹ and energy resolution better than 200 meV.[7](https://www.ascent.network/product/xpeem-spectro-microscope/) **SPELEEM** combines low-energy electron microscopy with spectroscopic imaging,[21](https://doi.org/10.1142/s0218625x98001626) and **laser microspot spectrometers** focus VUV light to diffraction-limited spots.[8](https://www.sciencedirect.com/science/article/abs/pii/S0039602803001961)\n\n## Applications\n\nX-PEEM chemical mapping works on conductors and insulators, demonstrated on cyanobacteria, cancer cells, and a 4.4-billion-year-old Jack Hills zircon using image-stack ratio maps at XANES edges.[6](https://home.physics.wisc.edu/gilbert2/wp-content/uploads/sites/3/2017/08/85.pdf) XPEEM quantified iodine doping at 1 at.% in monolayer and 2 at.% in bilayer graphene domains, evidencing adsorption and intercalation.[7](https://www.ascent.network/product/xpeem-spectro-microscope/) Deep-UV excited PEEM achieves nanoscale spectral imaging of atomically thin MoS₂ buried between Al₂\\( O_{3} \\) and SiO₂, with resolution below the photon wavelength because the electrons sense the optical response.[25](https://www.osti.gov/biblio/1866009) [Magnetic domain](https://www.edgepedia.org/magnetic-domain) structure is accessible through XMCD or XMLD contrast with polarized photons.[2](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf) With tunable EUV sources, momentum microscopy supports 3D photoemission orbital tomography, that is, full momentum-energy-resolved spectra of molecular orbitals.[26](https://www.nature.com/articles/s41467-026-74308-1)\n\n## Limitations and alternatives\n\n**Charging** is a major failure mode on insulators. Localized charge distorts the electrostatic field near the surface and can shift XPS core-level binding energies by up to several hundred eV, while XANES-type absorption measurements are much less affected. Flood-gun neutralization is impractical because the sample sits at over −10 kV; remedies include thinner samples (below 100 nm), transmission geometry with a metal photocathode, evaporated metallic layers, or reduced photon flux, all at a cost in signal or resolution.[27](https://home.physics.wisc.edu/gilbert/wp-content/uploads/sites/3/2017/08/67.pdf) **Space charge** from collective Coulomb repulsion of photoelectrons degrades spatial resolution and broadens and shifts photoemission peaks; with a kHz gas-discharge EUV source, a flux threshold of about 2 \\(e^{-}\\)/(µm²·pulse) limits resolution.[5](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29) When analyte concentration is low, resolution must be traded for signal, and sharp sample edges rapidly degrade PEEM imaging.[6](https://home.physics.wisc.edu/gilbert2/wp-content/uploads/sites/3/2017/08/85.pdf)\n\n**Ambient pressure** excludes projection microscopes: the \\( 10^{6} \\text{–} 10^{7} \\) V/m sample fields needed for collection efficiency rule out operation at atmospheric pressure. SPEM adapts through electron-transparent membranes (graphene, graphene oxide, h-BN), pinhole reaction cells (pressures up to 1 hPa), or dynamic high-pressure gas jets.[28](https://link.springer.com/article/10.1007/s11244-015-0519-1)\n\nCompared with laboratory XPS, whose low photoelectron yield from conventional x-ray tubes historically limited spatial resolution, synchrotron and EUV spectromicroscopy adds lateral resolution at the cost of complexity.[3](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X) kPEEM competes with micro-ARPES on energy resolution while being much faster.[9](https://nffa.eu/offer/area/technique/?id=6305) Published sources do not provide direct quantitative comparisons with scanning Auger microscopy or STXM. Recent work has moved toward table-top sources, with time-resolved momentum microscopy using high-harmonic generation reaching tens of femtoseconds time resolution,[12](https://www.nature.com/articles/s41598-025-86660-1) and the first 3D photoemission orbital tomography with a table-top femtosecond EUV source already reported.[26](https://www.nature.com/articles/s41467-026-74308-1)\n\n## References\n\n1. [X-ray photoemission electron microscopy (XPEEM), Elettra Nanospectroscopy beamline](https://www.elettra.eu/lightsources/elettra/elettra-beamlines/nanospectroscopy/xpeem.html)\n2. [PEEM/XAS beamline, SOLARIS National Synchrotron Radiation Centre](https://synchrotron.uj.edu.pl/documents/1457771/114907010/linia-1-EN.pdf)\n3. [Synchrotron-based photoelectron microscopy (review of SPEM and XPEEM)](https://www.sciencedirect.com/science/article/abs/pii/S016890020802024X)\n4. [Development of a Photoemission Microscopy Apparatus Using a Vacuum Ultraviolet Laser (NIMS, e-J. Surf. Sci. Nanotechnol. 22, 46–52, 2024)](https://www.jstage.jst.go.jp/article/ejssnt/22/1/22_2023-066/_pdf/-char/ja)\n5. [On space charge effects in laboratory-based photoemission electron microscopy using compact gas discharge extreme ultraviolet sources (New J. Phys.)](https://iopscience.iop.org/article/10.1088/1367-2630/abbc29)\n6. [SPHINX X-PEEM performance tests (Frazer et al., Ultramicroscopy 2004)](https://home.physics.wisc.edu/gilbert2/wp-content/uploads/sites/3/2017/08/85.pdf)\n7. [XPEEM Spectro-microscope – ASCENT+ (NanoESCA MkI, Scienta Omicron at CEA-Leti)](https://www.ascent.network/product/xpeem-spectro-microscope/)\n8. [Microspot photoemission spectrometer based on FS-VUV radiation (Munakata et al., Surface Science)](https://www.sciencedirect.com/science/article/abs/pii/S0039602803001961)\n9. [PhotoEmission Microscopy | NFFA.eu technique catalogue](https://nffa.eu/offer/area/technique/?id=6305)\n10. [Electron Spectroscopy of Surfaces (DTU Nanolab FOPRA lab course notes)](https://labadviser.nanolab.dtu.dk/images/f/f7/Electron_Spectroscopy_of_surfaces.pdf)\n11. [High-resolution XPS spectromicroscopy (Surf. Interface Anal., 2010)](https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.3521)\n12. [Time-resolved momentum microscopy with fs-XUV photons at high repetition rates with flexible energy and time resolution (Scientific Reports, 2025)](https://www.nature.com/articles/s41598-025-86660-1)\n13. [Photoemission spectroscopy, from early days to (Reinert & Hüfner, New J. Phys. 2005)](https://iopscience.iop.org/article/10.1088/1367-2630/7/1/097/pdf)\n14. [O. H. Griffith and colleagues (1972). Photoelectron Microscopy: A New Approach to Mapping Organic and Biological Surfaces. Proceedings of the National Academy of Sciences.](https://doi.org/10.1073/pnas.69.3.561)\n15. [G. Beamson, H. Q. Porter, D. W. Turner (1981). Photoelectron spectromicroscopy. Nature.](https://doi.org/10.1038/290556a0)\n16. [B. P. Tonner, G. R. Harp (1989). Photoyield spectromicroscopy of silicon surfaces using monochromatic synchrotron radiation. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.](https://doi.org/10.1116/1.575760)\n17. [H. H. Rotermund and colleagues (1989). Imaging of spatial pattern formation in an oscillatory surface reaction by scanning photoemission microscopy. The Journal of Chemical Physics.](https://doi.org/10.1063/1.456735)\n18. [Harald Ade and colleagues (1990). X-ray spectromicroscopy with a zone plate generated microprobe. Applied Physics Letters.](https://doi.org/10.1063/1.103064)\n19. [A UHV-compatible photoelectron emission microscope for applications in surface science (Ultramicroscopy, 1991)](https://doi.org/10.1016/0304-3991%2891%2990146-w)\n20. [Laser based photoelectron spectromicroscope (Surface Science, 1993)](https://doi.org/10.1016/0039-6028%2893%2991018-k)\n21. [Th. Schmidt and colleagues (1998). SPELEEM: Combining LEEM and Spectroscopic Imaging. Surface Review and Letters.](https://doi.org/10.1142/s0218625x98001626)\n22. [A Locatelli, E Bauer (2008). Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM. Journal of Physics Condensed Matter.](https://doi.org/10.1088/0953-8984/20/9/093002)\n23. [T. T. Luu and colleagues (2015). Extreme ultraviolet high-harmonic spectroscopy of solids. Nature.](https://doi.org/10.1038/nature14456)\n24. [NanoESCA beamline, Elettra Sincrotrone Trieste](https://www.elettra.eu/elettra-beamlines/Nanoesca.html)\n25. [Spectral and polarization based imaging in deep-ultraviolet excited photoelectron microscopy (OSTI.GOV record)](https://www.osti.gov/biblio/1866009)\n26. [Table-top three-dimensional photoemission orbital tomography with a femtosecond extreme ultraviolet light source (Nature Communications, 2026)](https://www.nature.com/articles/s41467-026-74308-1)\n27. [Charging phenomena in PEEM imaging and spectroscopy (Ultramicroscopy 83, 129–139, 2000)](https://home.physics.wisc.edu/gilbert/wp-content/uploads/sites/3/2017/08/67.pdf)\n28. [Recent Approaches for Bridging the Pressure Gap in Photoelectron Microspectroscopy (Topics in Catalysis)](https://link.springer.com/article/10.1007/s11244-015-0519-1)\n\n---\n*Topic: Encyclopedia › Physical world and mathematics › Physics › Physics methods, practice, and community › Electron microscopy methods*\n\n*Initially written Sep 29, 2026 · Reviewed: Sep 30, 2026 · Edited: Oct 15, 2026 · Last review: Sep 30, 2026*\n\n*Copyright 2026 EdgeChat AI, a subsidiary of Biostate AI.*\n\nLicense: Edgepedia Community License 1.0, https://www.edgepedia.org/edgepedia/license\n", "same_as": [], "url": "https://www.edgepedia.org/microspectroscopy", "markdown_url": "https://www.edgepedia.org/microspectroscopy.md", "license": { "name": "Edgepedia Community License 1.0", "url": "https://www.edgepedia.org/edgepedia/license", "summary": "Free with credit, commercial use included. AI training is open to everyone. For other uses, organizations over USD 100M in revenue or 100M monthly users license separately.", "spdx": "LicenseRef-Edgepedia-Community-1.0" }, "credit": "\"Microspectroscopy\", Edgepedia (EdgeChat), https://www.edgepedia.org/microspectroscopy. Edgepedia Community License 1.0.", "credit_md": "\"[Microspectroscopy](https://www.edgepedia.org/microspectroscopy)\", Edgepedia (EdgeChat), [https://www.edgepedia.org/microspectroscopy](https://www.edgepedia.org/microspectroscopy). [Edgepedia Community License 1.0](https://www.edgepedia.org/edgepedia/license).", "credit_html": "\"Microspectroscopy\", Edgepedia (EdgeChat), https://www.edgepedia.org/microspectroscopy. Edgepedia Community License 1.0.", "speakable": "Microspectroscopy, also called photoelectron microspectroscopy or photoemission spectromicroscopy, is a family of surface-analysis methods that maps chemical state and electronic structure with nanometer spatial resolution." }