36 articles
Scattering-type scanning near-field optical microscopy
Scattering-type scanning near-field optical microscopy (s-SNOM, also called s-NSOM) is a scanning probe technique measuring surface optical properties at 10–20 nm resolution, surpassing the diffraction limit from visible to terahertz light.
Single-molecule AFM with CO-functionalized tips
Single-molecule AFM with CO-functionalized tips is a form of atomic force microscopy, introduced at IBM Zurich in 2009, that images individual atoms and chemical bonds within one molecule.
SQUID-on-tip microscopy
SQUID-on-tip microscopy, or SOT, is a scanning probe technique that images magnetic fields, currents, and heat dissipation at the nanoscale using a nanoSQUID on a sharp tip.
Tapping mode
Tapping mode, also known as intermittent-contact or amplitude modulation mode, is an atomic force microscopy technique whose oscillating tip briefly taps the surface, protecting soft and biological samples.
Terahertz near-field microscopy
Terahertz near-field microscopy is a family of scanning probe techniques that image materials with terahertz radiation at resolutions far below the diffraction limit, using sharp tips or small apertures.
Tip-enhanced Raman spectroscopy
Tip-enhanced Raman spectroscopy, or TERS, is a scanning probe technique demonstrated in 2000 that merges the chemical specificity of Raman with the spatial resolution of AFM or STM.