36 articles
Williamson–Hall analysis
Williamson–Hall analysis is an X-ray diffraction line-broadening method, proposed by G. K. Williamson and W. H. Hall in 1953, that separates peak broadening into size and strain contributions.
X-ray emission spectroscopy
X-ray emission spectroscopy (XES) is an element-selective technique measuring the X-ray photons emitted when a core hole is filled, probing electronic structure, spin state, and ligand environment.
X-ray excited optical luminescence
X-ray excited optical luminescence (XEOL) is a spectroscopy technique in which X-ray absorption makes a material emit visible, ultraviolet, or near-infrared light, measured against X-ray energy.
X-ray linear dichroism
X-ray linear dichroism (XLD) is the difference in a material's x-ray absorption between two orthogonal linear polarizations, arising from anisotropic unoccupied electronic states; its magnetic variant probes antiferromagnetic order.
X-ray reflectivity
X-ray reflectivity (XRR), also called X-ray reflectometry, is a surface-sensitive analytical technique measuring reflected X-rays at grazing angles to determine film thickness, density, and roughness.
X-ray reflectometry
X-ray reflectometry (XRR), also called specular XRR, is a nondestructive technique that measures reflected X-ray intensity versus angle to determine thin-film thickness, density, and interface roughness.